Dielectric Constant and Loss Tangent of Silicon at 700–900 GHz at Cryogenic Temperatures - Observatoire de Paris Access content directly
Journal Articles IEEE Microwave and Wireless Components Letters Year : 2019

Dielectric Constant and Loss Tangent of Silicon at 700–900 GHz at Cryogenic Temperatures

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https://hal-obspm.ccsd.cnrs.fr/obspm-03988457

Submitted on : Tuesday, February 14, 2023-2:14:59 PM

Last modification on : Thursday, July 18, 2024-11:14:06 AM

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obspm-03988457 , version 1 (14-02-2023)

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Kangmin Zhou, Sylvain Caroopen, Yan Delorme, Michele Batrung, Maurice Gheudin, et al.. Dielectric Constant and Loss Tangent of Silicon at 700–900 GHz at Cryogenic Temperatures. IEEE Microwave and Wireless Components Letters, 2019, 29 (7), pp.501-503. ⟨10.1109/LMWC.2019.2920532⟩. ⟨obspm-03988457⟩

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