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Derniers dépôts
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François Piquemal, Pascal Chrétien, José Morán‐meza, Frédéric Houzé, Alexandra Delvallée, et al.. Calibrating Resistance and Current Measurements in Conductive Probe Atomic Force Microscopy: New Reference Samples and Calibration Methods. Physica Status Solidi A (applications and materials science), 2025, ⟨10.1002/pssa.202400711⟩. ⟨hal-04922885⟩
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